Electrical and semiconductor technology
The raw materials we use stand out for their high level of purity.The high chemical inertness, compatibility with pure silicon as well as electrical insulation and high temperature resistance make silicon nitride components an ideal match for electrical and semiconductor applications.
That is why our silicon nitride is used to manufacture plates and disks, which are used, for example, as wafer probe cards and as support structures for wafer processing. Ceramic grippers enable contamination-free loading of the wafers.
We also offer our customers high-strength insulators, shielding plates and transport rollers for coating systems as well as winding supports for inductors. Silicon nitride may even be used as a substrate material for high temperature resistant and mechanically resilient semiconductor components and circuits.
Furthermore, FCTI manufactures crucibles and crucible components for AlN or SiC single crystal growing systems based on refractory carbides such as TaC and WC.
Typical components:
Application examples
![](/templates/yootheme/cache/72/FCT_Ingenieurcheramik_Halbleitertechnik_waver_probe_card_01-7213ed44.jpeg)
Wafer Probe Cards
![](/templates/yootheme/cache/3b/FCT_Ingenieurcheramik_Halbleitertechnik_waver_probe_card_03-3b174f28.jpeg)
Wafer Probe Cards
![](/templates/yootheme/cache/f4/FCT_Ingenieurkeramik_Elektrotechnik_Einkristallzuechtungsanlagen-f46e19c7.jpeg)
Single crystal growing systems
![](/templates/yootheme/cache/03/FCT_Ingenieurkeramik_Elektrotechnik_keramische_Greifer-039623e0.jpeg)
ceramic grippers
![](/templates/yootheme/cache/a8/FCT_Ingenieurkeramik_Elektrotechnik_LTTC_Keramiken-a800da5a.jpeg)
LTCC ceramic
![](/templates/yootheme/cache/66/FCT_Ingenieurkeramik_Elektrotechnik_Siliziumnitrid_Bauteil-662ddaaa.jpeg)
Silicon nitrate components
![](/templates/yootheme/cache/85/FCT_Ingenieurkeramik_Elektrotechnik_hochfeste_Isolatoren-85b5550d.jpeg)
high strength insulators
![](/templates/yootheme/cache/9d/FCT_Ingenieurcheramik_Halbleitertechnik_waver_probe_card-9d808c7c.jpeg)
Wafer Probe Cards
![](/templates/yootheme/cache/1f/FCT_Ingenieurcheramik_Halbleitertechnik_waver_probe_card_02-1f951e1e.jpeg)